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SYMPOSIUM J Co-sponsored by SBMM as part of MICROMAT 2006 (10th Brazilian Congress of Materials Microscopy) The multidisciplinarity and the growing interest in forensic investigation has prompted the inclusion of dedicated sessions in nearly all recent events of Electron Microscopy worldwide. In this regard, The Brazilian Society of Microscopy and Microanalysis (SBMM) is encouraging the development of research in this field, by sponsoring a second edition of a specific annual symposium on the topic, the 2 nd SBMACF, an enterprise born from the establishment of a S&T Program applied to Security, whose aim is to set up cooperation and integration between the Brazilian scientific/technologic communities and state and federal criminal laboratories. The use of electron microscopy and associated techniques in forensic investigation dates from the 60s, when gunshot residues (GSR) were first analyzed by SEM/EDS. In addition to GSR analysis, optical (conventional, polarized, fluorescence, etc) and electron microscopy techniques allow the examination of a multitude of samples and trace evidence, such as: orientation and concentration of elements (including blood) in clothing (fibres) and objects; detection of metallic residues in textiles samples, cadaveric gloves and bones (in cases of injury due to sharp objects and fireams), analysis of trace evidence such as glass in projectiles, which enables to confirm bullet trajectory; paint pigments in objects found in crime scenes, toolmarks and identification of oblitered serial number. Presentations will emphasize materials analysis: serial number restoration in metals and polymers, toolmarks and failure analysis. Contributions covering all topics in optical and/or electron microscopy applications in forensic science are sought, including:
Chair:
Copyright 2006 |
