5encontro@sbpmat.org.br

Phone:
(+5548) 3234-7896 R.: 210 e
(+5548) 3331-9268 R.: 210

Working hours:
8 to 12 a.m. and 1:30 to 5:30 p.m.
(Alexandre Dias and Laura Bertuzzi)


 

Scientific Program

SYMPOSIUM F
NANOSTRUCTURES AND DEFECT ANALYSIS BY ELECTRON MICROSCOPY

A fundamental understanding of the effects of processing on the size, shape, structure and chemistry of nanomaterials (particles, tubes, rods, sheets, etc.) and related nanostructures is required for successful incorporation of these particles in industrial applications. These variables and the resulting properties of metal, semiconductor and ceramic nanomaterials are all potentially functions of the formation method. Observations can be made by several techniques but transmission electron microscopy is acknowledged to be the essential tool for any complete characterization. The use of TEM varies from the routine assessment of size and shape to the full analysis of the composition of heterogeneous nanomaterials and defects within these entities. Papers will be included in this Symposium on the use of TEM to address each of the broad characterization challenges (the size, shape, structure and chemistry) but will also address the advances being made on investigating these particles in environments other than UHV, on in situ modification and testing of these structures, and on the determination of bonding properties within and between nanoparticles.

The symposium aims at a wide range of TEM techniques and applications on nanostructured materials. Contributing papers are also welcome on topics of special interest such as:

  • Advances in TEM techniques applied to nanomaterials and nanoparticles;

  • Structure and deformation of nanostructures and thin film materials;

  • Characterization of interfaces and line defects;

  • Characterization of hard and soft nanobiomaterials;

  • Novel methods in sample preparation of nanomaterials;

  • Spectroscopy and analytical techniques applied to nanostructures.

Keywords: nanostructures, nanoparticles, nanobiomaterials, crystalline defects, interfaces, TEM, HREM, AEM, nanoscale analysis, nanodiffraction.

Symposium Organizers:

Chair:
Guillermo Solórzano
guilsol@dcmm.puc-rio.br
Depto. de Ciência dos Materiais e Metalurgia, PUC-Rio

Co-Chair:
Barry Carter
carter@cems.umn.edu
University of Minnesota, USA

Scientific Committee

Daniel Ugarte (LNLS)
Feranando Galembeck (Unicamp)
Karla Kalzuweit (UFMG)
Paula M. Jardim (PUC-Rio)
Paulo F. Fichtner (UFRGS)
Walter Botta Filho (UFSCar)

Invited Speakers (to be confirmed)

Christian Colliex (Orsay, France)
Daniel Ugarte (Unicamp)
Eva Olsen (Goteborg, Sweden)
Grant Norton (Washington State)
Jim Bentley (Oak Ridge NL)
Jimmy Liu (Monsanto)
Mark Aindow (U. Connecticut)
Pratihba Gai (Du Pont)
Paul Midgley (Cambridge)
Walter Botta (UFSCar)
Z. L. Wang (Georgia Tech.)

Papers from this Symposium will be published in a Special Issue of Journal of Materials Science

To be considered for this special issue, the Brazilian MRS paper number should precede the title of the paper on the manuscript. This number will be removed before publication.

The submission window for full manuscripts will be October 1 until November 30, 2006.

1) Go to www.editorialmanager.com/jmsc/
2) Follow Instructions for Authors
3) Be sure to select "Brazil MRS 2006" for your submission category

Journal of Materials Science Editors Grant Norton, Mark Aindow and Barry Carter will be present at the meeting to answer any questions.

All papers will be fully reviewed in the usual way. Symposia chairs will be sent a copy of each submitted paper