Symposium M

Electron Microscopy: from micro to nanoanalysis


Electron Microscopy is one of the most powerful tools for materials characterization and it is indispensable for nanoscience and nanotechnology. The combination of electron diffraction, x-ray spectroscopy and electron energy loss spectroscopy with many imaging modes puts electron microscopy among the most powerful and flexible characterization techniques. In recent years, many advances in electron optics and detectors systems have enhanced electron microscopes in several ways. This symposium provides an open forum for the discussion of recent research using electron microscopy techniques applied to Material Science. The symposium aims to gather together scientist and students using electron microscopy to share experience and to learn from each other from basic use of electron microscopy to application reaching the state-of-the-art in the field.

Session Topics:

Tentative List Invited Speakers:

Alexander Glotter, Universitè Paris-Sud, Orsay, France
Raul Arenal, Institute of Nanoscience of Aragon, Spain
Thomas Hansen, Technical University of Denmark, Denmark
Stuart Wright, EDAX-TS, USA
Hugo Sandim, Universidade de São Paulo, Brasil
Angela Halfpenny, CSIRO Earth Science and Resource Engineering, Australia

Symposium organizers:

Carlos Alberto Ospina Ramirez, Centro Nacional de Pesquisa em Energia e Materiais (CNPEM) - Brazilian Nanotechnology National Laboratory (LNNano)
Luiz Fernando Zagonel , Universidade Estadual de Campinas Instituto de Física, Brasil
Leonardo Lagoeiro, Universidade Federal de Ouro Preto, Brasil
Luciano Andrey Montoro, Universidade Federal de Minas Gerais, Departamento de Química, Brasil
Jefferson Bettini , Centro Nacional de Pesquisa em Energia e Materiais, Laboratório Nacional de Nanotecnologia - LNNano, Brasil
Paola Barbosa, Universidade Federal de Minas Gerais, Centro de Microscopia, Brasil