VII Encontro da SBPMat

- Outlines of symposia
- General Timetable
- Timetable of oral and poster presentations

Administration
Aptor
7encontro@sbpmat.org.br
(16) 3371-7698

Electron Microscopy Courses

Principal Organizer:
      Nome: Ruth Hinrichs
      Filiação profissional: UFRGS
      Endereço: Av. Bento Gonçalves 9500
                     Campus do Vale
                     Instituto de Geociências c.p. 15001
                     91501-970 Porto Alegre RS
      Telefone: 051 3308 7144 ou 7259 ou 6539
      Fax: 051 3308 7302
      E-mail: ruth.hinrichs@ufrgs.br

Co-organizers:
      Nome:   Karla Balzuweit
      Filiação profissional: UFMG
      Endereço:Av. Antônio Carlos 6627
                      CEP 30.270.901-970 - Belo Horizonte - Brasil
      Telefone: +55 (31) 3409-5664, +55 (31) 3409-7571
      Fax:+55 (31) 3409-5600
      E-mail: karla@fisica.ufmg.br

      Nome:   Sidnei Paciornik
      Filiação profissional: PUC-RIO
      Endereço:Rua Marques de S. Vicente 225 - Sala 501L
                        Gávea
                        22453-900 - Rio de Janeiro, RJ - Brasil
                        Caixa-Postal: 38008
      Telefone: (21) 31141243      Fax(21) 31141236
      E-mail: sidnei@puc-rio.br

Introduction
Electron microscopy techniques are becoming increasingly important in research and development. The target audience of these courses is the group of people in need of further details on electron-matter interaction, on the relationship of beam-parameters to image quality and analysis reliability, and on the influence of sample preparation on these results.
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Theoretical courses on basic principles of scanning electronic microscopy, on microanalysis in TEM and SEM, sample preparation for TEM and SEM and image analysis will be held.

SEM for beginners is a 3h course, about SEM instrumentation, electron-matter interaction, digital image formation, electron beam control, differences between secondary and backscattered electron images, contrast, brightness, spot size and astigmatism.
Microanalysis for beginners is a 2h course on qualitative and quantitative microanalysis, spot analysis, line scans and elementary maps, with emphasis on the pitfalls in spectrum interpretation.

Microanalysis in the TEM (2h) has the Microanalysis for beginners (or the MEV for beginners held in Buzios 2007) as a prerequisite and shows the comparison between EELS and EDX analysis in TEM. Introduction to the theory and examples with GIF.
Sample preparation for SEM and TEM (3h) using fracture, drying, milling, cutting, polishing, ion-milling, and coating.

Digital Microscopy, Image Processing and Analysis: Outline: · Digital Microscopy (the integration microscope- computer- digital image; automation in microscopy; auto-focus and extended focus; mosaic images; co-site microscopy); Image Processing (pre-processing techniques, background correction and noise reduction; detecting objects, segmentation techniques; post-processing, basic morphological operations); Image Analysis (obtaining quantitative information, measuring parameters, size, shape, texture and spatial distribution)

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