Electron Microscopy Courses

Principal Organizer:
      Nome: Ruth Hinrichs
      Filiação profissional: UFRGS
      Endereço: Av. Bento Gonçalves 9500
                     Campus do Vale
                     Instituto de Geociências c.p. 15001
                     91501-970 Porto Alegre RS
      Telefone: 051 3308 7144 ou 7259 ou 6539
      Fax: 051 3308 7302
      E-mail: ruth.hinrichs@ufrgs.br

Co-organizers:
      Nome:   Karla Balzuweit   
      Filiação profissional: UFMG
      Endereço:Av. Antônio Carlos 6627
                      CEP 30.270.901-970 - Belo Horizonte - Brasil
      Telefone: +55 (31) 3409-5664,  +55 (31) 3409-7571
      Fax:+55 (31) 3409-5600
      E-mail: karla@fisica.ufmg.br

      Nome:   Sidnei Paciornik
      Filiação profissional: PUC-RIO
      Endereço:Rua Marques de S. Vicente 225 - Sala 501L
                        Gávea
                        22453-900 - Rio de Janeiro, RJ - Brasil 
                        Caixa-Postal: 38008
      Telefone:  (21) 31141243      Fax(21) 31141236        
      E-mail: sidnei@puc-rio.br

Introduction
Electron microscopy techniques are becoming increasingly important in research and development. The target audience of these courses is the group of people in need of further details on electron-matter interaction, on  the relationship of beam-parameters to image quality and analysis reliability, and on the influence of sample preparation on these results.
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Theoretical courses on basic principles of scanning electronic microscopy, on microanalysis in TEM and SEM, sample preparation for TEM and SEM and image analysis will be held.

• SEM for beginners is a 3h course, about SEM instrumentation, electron-matter interaction, digital image formation, electron beam control, differences between secondary and backscattered electron images, contrast, brightness, spot size and astigmatism.
• Microanalysis for beginners is a 2h course on qualitative and quantitative microanalysis, spot analysis, line scans and elementary maps, with emphasis on the pitfalls in spectrum interpretation.

• Microanalysis in the TEM (2h) has the Microanalysis for beginners (or the MEV for beginners held in  Buzios 2007) as a prerequisite and shows the comparison between EELS and EDX analysis in TEM. Introduction to the theory and examples with GIF.
• Sample preparation for SEM and TEM (3h) using fracture, drying, milling, cutting, polishing, ion-milling, and coating.

• Digital Microscopy, Image Processing and Analysis: Outline: · Digital Microscopy (the integration microscope- computer- digital image; automation in microscopy; auto-focus and extended focus; mosaic images; co-site microscopy); Image Processing (pre-processing techniques, background correction and noise reduction; detecting objects, segmentation techniques;  post-processing, basic morphological operations); Image Analysis (obtaining quantitative information, measuring parameters, size, shape, texture and spatial distribution)

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