Symposium M: Electron Microscopy at the Industry

Principal Organizer
André Luiz Pinto
Instituto Militar de Engenharia (IME)
Praça General Tibúrcio, 80 - Urca
21 2546 7254
21 2546 7049
pinto@ime.eb.br

Co-organizer
Luiz Henrique de Almeida   
COPPE/UFRJ
Av Brigadeiro Trompowski, s/no, Bloco F, 2º Andar – Programa de Engenharia Metalúrgica e de Materiais
21 2562 8510
lha@metalmat.ufrj.br

Many microscopy techniques are now mature and widely used by the industry and researchers on technologies applied to industries. In this Symposium, experts in microscopy will gather and share their experiences in materials science.

Various industrial segments employ microscopy techniques for developing new materials, in optimizing materials for specific applications, as well as in quality control and in failure analysis of materials. In addition, efforts have been made to seek materials that meet the complex, growing demand from industry. In this Symposium, it is hoped that professionals from both the academic and industrial sectors will contribute, with the aim of fostering integration and encouraging joint search for industrial innovation. Among the various techniques to be discussed in the Symposium are Optical Microscopy, Digital Image Processing, Quantitative Microscopy, Scanning Electron Microscopy, Transmission Electron Microscopy, Scanning Probe Microscopy and their associated techniques. 

Topics
The scope of the Symposium is rather broad and includes: 

• Recent, actual cases of failure analysis
• use of digital image processing in quality control
• influence of materials microstructure on industrial applications
• microstructural control of next generation materials to be used at high temperatures       
• microstructural control of materials for electronic applications.

Invited speakers
Sidnei Paciornik (PUC-Rio)
Luiz Henrique de Almeida (UFRJ)

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