Symposium L: High Resolution Electron Microscopy
Principal organizer:
Antonio Jose Ramirez
Laboratório Nacional de Luz Síncrotron - LNLS
Rua Giuseppe Máximo Scolfaro, 10.000, CP 6192, Campinas, SP.
19 – 3512.1041
E-mail: ramirez@lnls.br
Co-organizers:
Edson Roberto Leite
Universidade Federal de São Carlos - UFSCar
Rodovia Washington Luís, Km 235, CP 676, São Carlos, SP.
16 – 33518214
E-mail: derl@power.ufscar.br
Luciano Andrey Montoro
Laboratório Nacional de Luz Síncrotron - LNLS
Rua Giuseppe Máximo Scolfaro, 10.000, CP 6192, Campinas, SP.
19 – 3512.1256
E-mail: lmontoro@lnls.br
Paulo F. P. Fichtner
Universidade Federal do Rio Grande do Sul - UFRGS
Av. Bento Gonçalves, 9500, CP 15051, Porto Alegre, RS.
51 – 3308.9468
Fax: 51 – 3308.9469
E-mail: paulo.fichtner@ufrgs.br
The High Resolution Electron Microscopy Techniques, including High Resolution Transmission Electron Microscopy (HRTEM), High Resolution Scanning Transmission Electron Microscopy (HRSTEM), and High Resolution Scanning Electron Microscopy (HRSEM), are among the most powerful tools for materials characterization at the nano and atomic scales, which have become indispensable for nanoscience and nanotechnology. Their possible combination with other techniques such as electron diffraction, x-ray spectroscopy, electron energy loss spectroscopy and quantitative image analysis make electron microscopy a powerful characterization technique.
High Resolution Transmission Electron Microscopy (HRTEM), Scanning Transmission Electron Microscopy (HRSTEM), and Scanning Electron Microscopy (HRSEM) have been extensively applied to determine morphological, structural, chemical, and electronic properties of materials from the nanometric to the sub-angstrom ranges. Conventional and high resolution imaging combined with electron diffraction put electron microscopy among the most advanced characterization techniques for crystalline as well as short-range order materials. With the assistance of energy dispersive X-ray spectroscopy (XEDS) and electron energy loss spectroscopy (EELS), the transmission electron microscope becomes a versatile and comprehensive tool for characterizing the chemical and electronic properties at the nanoscale. In recent years, a number of novel developments have been made in HRTEM for nanotechnology, such as: in-situ experiments to study dynamical processes at the nanoscale, correlating the materials physical properties and structures; holographic imaging of electric and magnetic fields; quantitative chemical mapping at sub-nanometer resolution and methodologies for aberration-corrected imaging based on hardware and/or software for reconstruction of the output wave, which enhances resolution to sub-angstrom level. This symposium welcomes contributed presentations covering all areas of high resolution electron microscopy dedicated to materials characterization as well as instrumentation or software development. Presentations using high resolution microscopy to characterize nanomaterials are especially welcome.
The topics covered by the Symposium include:
Scientific Committee
Daniel M. Ugarte – UNICAMP, (ugarte@lnls.br)
Daniela Zanchet – LNLS, (zanchet@lnls.br)
Jefferson Bettini – LNLS, (bettini@lnls.br)
Marcelo O. Orlandi – UNESP - Ilha Solteira, (orlandi@dfq.feis.unesp.br)
Monica A. Cotta – UNICAMP, (monica@ifi.unicamp.br)
Invited Speakers
Christopher John Kiely (LEHIGH)
Marcelo Ornaghi Orlandi (UNESP)
Daniela Zanchet (LNLS)
Knut Urban (Ernst Ruska Centre IR-C)
Leandro Martín Socolovsky (INTECIN)