{"id":2618,"date":"2014-09-22T10:55:46","date_gmt":"2014-09-22T13:55:46","guid":{"rendered":"http:\/\/sbpmat.org.br\/?p=2618"},"modified":"2014-09-22T16:10:22","modified_gmt":"2014-09-22T19:10:22","slug":"xiii-encontro-da-sbpmat-palestras-tecnicas-dos-patrocinadores","status":"publish","type":"post","link":"https:\/\/www.sbpmat.org.br\/pt\/xiii-encontro-da-sbpmat-palestras-tecnicas-dos-patrocinadores\/","title":{"rendered":"XIII Encontro da SBPMat: palestras t\u00e9cnicas dos patrocinadores."},"content":{"rendered":"<p><strong>Palestrante:<\/strong> Shimadzu\/Tescan.<\/p>\n<p><strong>Tema:<\/strong> Microsc\u00f3pio Eletr\u00f4nico de Varredura com Feixe de \u00cdons e Detector TOF SIMS.<\/p>\n<p><strong>Resumo:<\/strong> O objetivo desta palestra \u00e9 apresentar uma nova t\u00e9cnica de an\u00e1lise qu\u00edmica, aplicada na pesquisa e desenvolvimento, voltado a detec\u00e7\u00e3o de elementos desde H, com resolu\u00e7\u00e3o lateral e de profundidade manom\u00e9trica e excelentes limites de detec\u00e7\u00e3o. Esta t\u00e9cnica utiliza o detector TOF SIMS acoplado a um canh\u00e3o de \u00edons.<\/p>\n<p><strong>Quando:<\/strong> 29 de setembro (segunda-feira), das 13:30 \u00e0s 14:00 horas.<\/p>\n<p><strong>Onde:<\/strong> no sal\u00e3o plen\u00e1rio do Centro de Conven\u00e7\u00f5es de Jo\u00e3o Pessoa.<\/p>\n<p>&#8212;&#8212;&#8212;&#8212;&#8212;&#8212;&#8212;&#8212;-<\/p>\n<p><strong>Palestrantes:\u00a0<\/strong>Mauro Porcu e Daniel Phifer (FEI).<\/p>\n<p><strong>Tema:<\/strong>\u00a0Prepara\u00e7\u00e3o de amostras com DualBeam\u2122\u00a0 de \u00faltima gera\u00e7\u00e3o e an\u00e1lise por MET para ci\u00eancia de materiais.<\/p>\n<p><strong>Resumo:<\/strong>\u00a0Site specific sample preparation is becoming essential for advanced material science as innovative workflows have been developed to enable atomic TEM resolution. The DualBeam-TEM workflow saves time and offers possibilities for analysis of specific areas with optimized orientation. Low voltage FIB cleaning and advanced manipulation allow lifting out sampled from bulk substrates and thinning with little to no significant damage. When coupled with the new FEI TEMs, it is possible to capture better compositional information from both traditional TEM thin sections and cylindrical \u201cpillar TEM samples\u201d. TEM EDS has advanced so much and EDS tomography is routinely performed with the new EDS geometry and fast data processing. Atomic material characterization thus highly benefits from newer DualBeam-TEM-sample-preparation-methodologies.<\/p>\n<p><strong>Quando:<\/strong>\u00a030 de setembro (ter\u00e7a-feira), das 13:30 \u00e0s 14:00 horas.<\/p>\n<p><strong>Onde:<\/strong>\u00a0no sal\u00e3o plen\u00e1rio do Centro de Conven\u00e7\u00f5es de Jo\u00e3o Pessoa.<\/p>","protected":false},"excerpt":{"rendered":"<p>Palestrante: Shimadzu\/Tescan. Tema: Microsc\u00f3pio Eletr\u00f4nico de Varredura com Feixe de \u00cdons e Detector TOF SIMS. Resumo: O objetivo desta palestra \u00e9 apresentar uma nova t\u00e9cnica de an\u00e1lise qu\u00edmica, aplicada na pesquisa e desenvolvimento, voltado a detec\u00e7\u00e3o de elementos desde H, com resolu\u00e7\u00e3o lateral e de profundidade manom\u00e9trica e excelentes limites de detec\u00e7\u00e3o. Esta t\u00e9cnica utiliza [&hellip;]<\/p>\n","protected":false},"author":4,"featured_media":0,"comment_status":"open","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[6],"tags":[522,526,523,524,527,285,525,528,424],"_links":{"self":[{"href":"https:\/\/www.sbpmat.org.br\/pt\/wp-json\/wp\/v2\/posts\/2618"}],"collection":[{"href":"https:\/\/www.sbpmat.org.br\/pt\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.sbpmat.org.br\/pt\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.sbpmat.org.br\/pt\/wp-json\/wp\/v2\/users\/4"}],"replies":[{"embeddable":true,"href":"https:\/\/www.sbpmat.org.br\/pt\/wp-json\/wp\/v2\/comments?post=2618"}],"version-history":[{"count":5,"href":"https:\/\/www.sbpmat.org.br\/pt\/wp-json\/wp\/v2\/posts\/2618\/revisions"}],"predecessor-version":[{"id":2621,"href":"https:\/\/www.sbpmat.org.br\/pt\/wp-json\/wp\/v2\/posts\/2618\/revisions\/2621"}],"wp:attachment":[{"href":"https:\/\/www.sbpmat.org.br\/pt\/wp-json\/wp\/v2\/media?parent=2618"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.sbpmat.org.br\/pt\/wp-json\/wp\/v2\/categories?post=2618"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.sbpmat.org.br\/pt\/wp-json\/wp\/v2\/tags?post=2618"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}