Symposium C: Mechanical Behavior of Thin Films, Surfaces and Coatings

Organizers

Carlos Mauricio Lepienski (DF - UFPR)
Sérgio de Souza Camargo  (COPPE - UFRJ)
Carlos Eugênio Foerster (DF - UEPG)

Specific methodologies are necessary to determine the mechanical and tribological properties of thin films, coatings and modified surface layers. These methodologies are based on the contact mechanics in micro and nanoscale. Indentation tests are employed to determine hardness, elastic modulus and scratch resistance. Brittle materials are subject to fracture, thus making it difficult to interpret the data from mechanical tests. Indentation tests are normally easy to perform but the interpretation of the results is not straightforward due to the triaxial stress distribution in the contact region. The study of mechanical properties in nanoscale is an area of increasing interest.  
This symposium pretend to be a forum to present the recent results on the mechanical behavior at small scales and to foment discussion about the different methodologies employed for mechanical characterization. The interaction of researchers from different areas is expected in order to improve the knowledge in the mechanical behavior at small scale. 
The topics of the symposium are the following:

• Mechanical characterization of thin films, coatings and modified surfaces: hard materials, polymers, ceramics, metals, composites, biomaterials etc.
• Nanoindentation, microhardness, scratch resistance, viscoelastic properties and toughness of thin films, coatings and surface layers.
• Nanotribology and mechanical characterization by atomic force microscopy.
• Residual stress
• Adhesion of films and coatings.
• Fracture behavior induced and analyzed by contact mechanics.
• New techniques for the mechanical characterization of thin films, coatings and surface layers. Limiting factors for application.
• Numerical methods to simulate the mechanical properties of thin films and coatings.
• Theoretical methods and simulation in contact mechanics.  

Scientific Committee:

André Paulo Tschiptschin (USP)
Fernando Lázaro Freire Jr. (PUC-Rio)
José Daniel Biasoli de Mello (UFU)
Vladimir Jesus Trava-Airoldi (INPE)
G. Cristina Godoy (UFMG)
Clodomiro Alves Jr. (UFRN)

Invited Speakers:

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