SYMPOSIUM D - NANO-SCALE STRUCTURAL CHARACTERIZATIONS OF MATERIALS

Remarkable advances continue to be made in electron microscopy instrumentation and techniques for applications to materials science. Characterization problems can now be tackled routinely at the nano-scale, even reaching atomic-scale resolution. The advances are mainly in the field of quantitative high-resolution image, atomic-resolution Z-contrasting image, elemental mapping by EDS and energy-filtered TEM or spectrum image, atomic resolution EELS for composition and bounding, quantitative CBED, electron holography, EBSD in the SEM for phase identification and orientation image microscopy, low-voltage microanalysis of bulk specimens, low-energy SEM, and in-situ experiments of dynamic phenomena. Advances in specimen preparation techniques, such as FIB also play important roll.

This symposium will honor the contribution of Prof. Manfred Rühle emphasizing how this recent developments in electron microscopy are being used to solve materials problems. Invited presentations will cover applications in a wide range of materials.

Contributions are requested that make use of recent developments in electron microscopy to solve materials problems in areas, such as:

• Structural metallic alloys, including development and phase transformations;

• Structural and electronic ceramics, composites and minerals;

• Particles, zeolites, catalyst, fullerenes and carbon nano-tubes;

• Microelectronic materials, semiconductors and photonics;

• Epitaxial and polycrystalline thin films and multilayers.

This symposium is organized jointly by SBPMat and MICROMAT Meetings.

Keywords: Nanostructures


Symposium Organizers

Guillermo Solórzano
DCMM/PUC RJ
guilsol@dcmm.puc-rio.br 

Joachim Mayer
Central Facility for Electron Micrsocopy, Aachen University
mayer@gfe.rwth-aachen.de 
 

This Symposium will be published as a special issue of Microscopy and Microanalysis (Cambridge)