The symposium aims at providing a forum for researchers interested in applying advanced methods of electron microscopy and spectroscopy, including aberration-corrected electron microscopy, and in-situ characterization in the various fields of microscopies to materials research. Nowadays, this approach is of fundamental and increasing importance in different technology fields, such as electronics, optics, communications, magnetics, energy and environment and covering the wide spectrum from nanostructures in functional materials, soft matter and bioscience to structural engineered materials for industrial infrastructure. Materials research on thin films, bulk materials, surfaces, materials at the nanoscale and at the interface between physical and life sciences is of prevailing interest because of its fundamental importance in understanding the chemical and physical and life properties of materials and in evaluating their potential for technological applications. Advanced microscopic and related spectroscopic techniques play a crucial role in characterizing the microstructure/nanostructures and the structure-property relationships of materials, as well as in metrology. Current topics will be highlighted in keynote presentations given by leading invited experts. Contributions in the topics indicated below and related are welcome.
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Abstract Submission
FAPESP Application
Manuscripts publication
Symposium System
Posters Printing Service
Important Dates
Symposium proposal submission
Until February 11th
Abstract submission
Until May 30th
Until June 15th
Notification of the abstracts status
July 12th
Deadline for abstracts modifications
July 21th
Notification of the accepted abstracts
July 22th
Deadline for extended abstracts
Until August 22th
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