Electron and Ion Beams provide complementary means to analyze and modify materials. This symposium focus on the strength of the techniques, emphasizing their complementary role in distinct areas of application. The characterization of materials with electron and ion beams comprise the use of standard transmission and scanning electron microscopy techniques, electron backscattering diffraction (EBSD), electron energy loss spectroscopy (EELS), X-ray spectroscopy (EDS and PIXE), elastic recoil detection analysis and Rutherford Backscattering spectrometry, and lattice cartography to characterize elastic deformations (stress) with electrons and ions. Materials modification with electron and ion beams comprise the simulation of radiation damage in nuclear (fission and fusion) reactors, the stability of nano-structured materials and devices for space and nuclear applications, the synthesis of embedded nanostructures in solid substrates and the use of focused ion beams to erode or sculpt nano- or micro-objects. The symposium also includes in-situ dynamic studies with ion and electron beams.