Proceedings
ISBN: 978-85-63273-33-8

### Symposium F

#### Advanced and Analytical Microscopy and Spectroscopy of Nanostructures and Engineering Materials

Scope of the Symposium

The symposium aims at providing a forum for researchers interested in applying advanced methods of electron microscopy and spectroscopy, including aberration-corrected electron microscopy, and in-situ characterization in the various fields of microscopies to materials research. Nowadays, this approach is of fundamental and increasing importance in different technology fields, such as electronics, optics, communications, magnetics, energy and environment and covering the wide spectrum from nanostructures in functional materials, soft matter and bioscience to structural engineered materials for industrial infrastructure. Materials research on thin films, bulk materials, surfaces, materials at the nanoscale and at the interface between physical and life sciences is of prevailing interest because of its fundamental importance in understanding the chemical and physical and life properties of materials and in evaluating their potential for technological applications. Advanced microscopic and related spectroscopic techniques play a crucial role in characterizing the microstructure/nanostructures and the structure-property relationships of materials, as well as in metrology. Current topics will be highlighted in keynote presentations given by leading invited experts. Contributions in the topics indicated below and related are welcome.

Abstracts will be solicited in (but not limited to) the following areas

- Applications of analytical electron microscopy in electronics, optics, communications, magnetics, energy and environment
- Phase identification and defect analysis in bulk structural materials
- Nanostructures in functional materials, soft matter and bioscience
- Materials research on thin films, surfaces, materials at the nanoscale
- In situ dynamic studies in the electron microscope, e-TEM
- Electron microscopy characterization on nanoparticles and nano-objects
- Applications in analytical tools, spectroscopy: EDS, EELS, PL/cathode luminescence, Raman
- Advanced imaging/analytical techniques: EBSD, EFTEM, spectrum imaging
- New developments in scanning probe microscopy/spectroscopy: AFM, STM and applications in materials research

List of invited speakers

- xxxx
  (xxxx)
- Paulo Ferreira
  (University of Texas)
- Paola Ayala
  (Universität Wien)
- Paulo Fichtner
  (Universidade Federal do Rio Grande do Sul)
- Edson Leite
  (Universidade Federal de São Carlos)

Symposium Organizers

- Guillermo Solorzano (PUC-Rio, Brazil)
- Daniel Lorscheitter Baptista (Instituto de Física, UFRGS)